AD9461BSVZ - ADI

The pictures are for reference only, and the specific specifications can be found in the product manual.

Part No

AD9461BSVZ
Manufacturer

ADI
ChipWorker Part#

CW16643433
Category

Analog to Digital, ADC IC
Package

TQFP-100
Description

ANALOG DEVICES AD9461BSVZ Analog to Digital Converter, 16Bit, 130MSPS, Single, 3.3V, 5V, TQFP
Documentation

Datasheet

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AD9461BSVZ Specifications

Attribute	Attribute Value

Part Number	AD9461BSVZ
Manufacturer	ADI
ChipWorker Part#	CW16643433
Category	Analog to Digital, ADC IC
Documentation	Datasheet
Mounting Style	Surface Mount
Number of Pins	100 Pin
Case/Package	TQFP-100
Supply Voltage (DC)	3.30V (min)
Supply Current	405 mA
Number of Circuits	1 Circuit
Number of Bits	16 Bit
Power Dissipation	2.4 W
Sample Rate	130000 KSPS
Resolution (Bits)	16.0 Bit
Input Capacitance	6.00 pF
Input Impedance	1.00 kΩ
Number of ADCs	1 ADC
Operating Temperature (Max)	85 ℃
Operating Temperature (Min)	-40 ℃
Number of Input Channels	1 Channel
Supply Voltage (Max)	5 V
Supply Voltage (Min)	3.3 V
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Size-Length	14 mm
Size-Width	14 mm
Size-Height	1 mm
Operating Temperature	-40℃ ~ 85℃
Product Lifecycle Status	Active
Packaging	Tray
RoHS	RoHS Compliant
Lead-Free Status	Lead Free
REACH SVHC Compliance	No SVHC
Mil-Spec	No
REACH SVHC Compliance Edition	2015/12/17
ECCN Code	3A001

Product Description

130 MSPS guaranteed sampling rate 78.7 dBFS SNR/90 dBc SFDR with 10 MHz input (3.4 V p-p input, 130 MSPS) 77.7 dBFS SNR with 170.3 MHz input (4.0 V p-p input, 130 MSPS) 77.0 dBFS SNR/84 dBc SFDR with 170 MHz input (3.4 V p-p input, 130 MSPS) 76.3 dBFS SNR/86 dBc SFDR with 225 MHz input (3.4 V p-p input, 125 MSPS) 89 dBFS two-tone SFDR with 169 MHz and 170 MHz (130 MSPS) 60 fsec rms jitter Excellent linearity DNL = ±0.6 LSB typical INL = ±5.0 LSB typical 2.0 V p-p to 4.0 V p-p differential full-scale input Buffered analog inputs LVDS outputs (ANSI-644 compatible) or CMOS outputs Data format select (offset binary or twos complement) Output clock available

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- Carefully tested and packaged by ChipWorker
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- Surface testing

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