BAV199LT1 - ON Semiconductor

The pictures are for reference only, and the specific specifications can be found in the product manual.

Part No

BAV199LT1
Manufacturer

ON Semiconductor
ChipWorker Part#

CW33427559
Category

Diode Array, TVS Diode Array
Package

SOT-23-3
Description

Diode Small Signal Switching 70V 0.715A 3Pin SOT-23 T/R
Documentation

Datasheet

BAV199LT1 Global Supplier

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BAV199LT1 Specifications

Attribute	Attribute Value

Part Number	BAV199LT1
Manufacturer	ON Semiconductor
ChipWorker Part#	CW33427559
Category	Diode Array, TVS Diode Array
Documentation	Datasheet
Mounting Style	Surface Mount
Number of Pins	3 Pin
Case/Package	SOT-23-3
Voltage Rating (DC)	70.0 V
Current Rating	215 mA
Capacitance	2.00 pF
Forward Voltage	1.25V @150mA
Reverse recovery time	3000 ns
Maximum Forward Voltage (Max)	1.25V @150mA
Forward Current (Max)	0.215 A
Operating Temperature (Max)	150 ℃
Operating Temperature (Min)	-65 ℃
Power Dissipation (Max)	300 mW
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Operating Temperature	-65℃ ~ 150℃
Product Lifecycle Status	Unknown
Packaging	Cut Tape (CT)
RoHS	Non-Compliant
Lead-Free Status	Contains Lead
ECCN Code	EAR99

Product Description

The switching diode is designed for high speed switching applications. This dual diode device contains two diodes in series encapsulated in a SOT-23 surface mount package.
Features
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Low Leakage Current Applications
Medium Speed Switching Times
Available in 8 mm Tape and Reel - Use BAV199LT1 to order the 7 inch/3,000 unit reel
Pb-Free Package is Available
S Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AECQ101 Qualified and PPAP Capable

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- Please check the technical specifications of the products when ordering.
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- Carefully tested and packaged by ChipWorker
- Vacuum packed
- Anti-static packaging
- Anti-vibration foam
- Income quality control (IQC), 800+ qualified distributors.
- Authorities test the chip to ensure the quality, authenticity and safety of your device.
- Decapsulation control
- X-ray inspection
- XRF inspection
- Electrical testing
- Surface testing

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