HMC341 - ADI

The pictures are for reference only, and the specific specifications can be found in the product manual.

Part No

HMC341
Manufacturer

ADI
ChipWorker Part#

CW61339111
Category

Amplifier chip
Package

-
Description

RF Amp Chip Single GP 30GHz 5.5V 3Pin Die
Documentation

Datasheet

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HMC341 Specifications

Attribute	Attribute Value

Part Number	HMC341
Manufacturer	ADI
ChipWorker Part#	CW61339111
Category	Amplifier chip
Documentation	Datasheet
Number of Pins	3 Pin
Case/Package	-
Supply Current	30 mA
Power Dissipation	310 mW
Gain	13 dB
Test Frequency	30 GHz
Operating Temperature (Max)	85 ℃
Operating Temperature (Min)	-55 ℃
Power Dissipation (Max)	310 mW
Supply Voltage	3 V
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Size-Height	0.1 mm
Operating Temperature	-55℃ ~ 85℃
Product Lifecycle Status	Unknown
Packaging	Tray
RoHS	RoHS Compliant
Lead-Free Status	Lead Free

Product Description

Product Details
The HMC341 chip is a GaAs MMIC Low Noise Amplifier (LNA) which covers the frequency range of 24 to 30 GHz. The chip can easily be integrated into Multi-Chip Modules (MCMs) due to its small (1.51 mm²) size. The chip utilizes a GaAs PHEMT process offering 13 dB gain from a single bias supply of + 3V @ 30 mA with a noise figure of 2.5 dB. All data is with the chip in a 50 ohm test fixture connected via 0.025 mm (1 mil) diameter wire bonds of minimal length 0.31 mm (<12 mils).
Applications
Millimeterwave Point-to-Point Radios
LMDS
VSAT & SATCOM
### Features and Benefits
Excellent Noise Figure: 2.5 dB
Gain: 13 dB
Single Supply: +3V @ 30 mA
Small Size: 1.42 x 1.06 x 0.1 mm

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- Please check the technical specifications of the products when ordering.
- MOQ is the minimum order quantity required to purchase each part.
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- Carefully tested and packaged by ChipWorker
- Vacuum packed
- Anti-static packaging
- Anti-vibration foam
- Income quality control (IQC), 800+ qualified distributors.
- Authorities test the chip to ensure the quality, authenticity and safety of your device.
- Decapsulation control
- X-ray inspection
- XRF inspection
- Electrical testing
- Surface testing

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