ITA25B1 - ST Microelectronics

The pictures are for reference only, and the specific specifications can be found in the product manual.

Part No

ITA25B1
Manufacturer

ST Microelectronics
ChipWorker Part#

CW21934800
Category

TVS Diode
Package

SOIC-8
Description

STMICROELECTRONICS ITA25B1 TVS Diode, Transil ITA Series, Bidirectional, 24V, 38V, SOIC, 8Pins
Documentation

Datasheet

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ITA25B1 Specifications

Attribute	Attribute Value

Part Number	ITA25B1
Manufacturer	ST Microelectronics
ChipWorker Part#	CW21934800
Category	TVS Diode
Documentation	Datasheet
Mounting Style	Surface Mount
Number of Pins	8 Pin
Case/Package	SOIC-8
Voltage Rating (DC)	25.0 V
Capacitance	300 pF
Power Rating	300 W
Breakdown Voltage	25 V
Number of Circuits	5 Circuit
Number of Positions	8 Position
Power Dissipation	300 W
Clamping Voltage	38 V
Test Current	1 mA
Max Breakdown Voltage	25 V
Peak Pulse Power	300 W
Min Breakdown Voltage	25 V
Reverse Breakdown Voltage	25 V
Operating Temperature (Max)	125 ℃
Operating Temperature (Min)	-55 ℃
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Size-Length	5 mm
Size-Width	4 mm
Size-Height	1.75 mm
Operating Temperature	-55℃ ~ 150℃
Product Lifecycle Status	Active
Packaging	Tube
RoHS	RoHS Compliant
Lead-Free Status	Lead Free
REACH SVHC Compliance	No SVHC
Mil-Spec	Yes
REACH SVHC Compliance Edition	2015/12/17
ECCN Code	EAR99

Product Description

The Transil ITA series TVS Array for data line protection. It provides high overvoltage protection by clamping action. It has instantaneous response to transient over-voltages makes them particularly suited to protect voltage sensitive devices such as MOS technology and low voltage supplied IC"s. The device allies high surge capability against energetic pulses with high voltage performance against ESD.
40A (8/20µs) High surge capability Transil array IPP
300W (8/20µs) Peak pulse power
Up to 6 bidirectional Transil functions
Low clamping factor (VCL/VBR) at high current level
Low leakage current
ESD protection up to 15kV

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- Carefully tested and packaged by ChipWorker
- Vacuum packed
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- Anti-vibration foam
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- Electrical testing
- Surface testing

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