S34ML02G100BHI000 - Cypress Semiconductor

The pictures are for reference only, and the specific specifications can be found in the product manual.

Part No

S34ML02G100BHI000
Manufacturer

Cypress Semiconductor
ChipWorker Part#

CW37397414
Category

Flash Memory, Flash
Package

BGA-63
Description

SLC NAND Flash Parallel 3.3V 2Gbit 256M x 8Bit 20ns 63Pin BGA Tray
Documentation

Datasheet

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S34ML02G100BHI000 Specifications

Attribute	Attribute Value

Part Number	S34ML02G100BHI000
Manufacturer	Cypress Semiconductor
ChipWorker Part#	CW37397414
Category	Flash Memory, Flash
Documentation	Datasheet
Mounting Style	Surface Mount
Number of Pins	63 Pin
Case/Package	BGA-63
Supply Voltage (DC)	2.70V (min)
Supply Current	30 mA
Number of Positions	63 Position
Number of Bits	8 Bit
Access Time	25 ns
Access Time(Max)	20 ns
Operating Temperature (Max)	85 ℃
Operating Temperature (Min)	-40 ℃
Supply Voltage	3.3 V
Supply Voltage (Max)	3.6 V
Supply Voltage (Min)	2.7 V
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Operating Temperature	-40℃ ~ 85℃
Product Lifecycle Status	Unknown
Packaging	Each
RoHS	RoHS Compliant
Lead-Free Status	Lead Free
ECCN Code	3A991.b.1.a

Product Description

The S34ML02G100BHI000 is a 2GB SLC NAND Flash Memory for embedded. It is offered in 3.3VCC and VCCQ power supply and with x8 or x16 I/O interface. The memory is divided into blocks that can be erased independently so it is possible to preserve valid data while old data is erased. The page size for x8 is bytes for x16 (1024 + 32) words. Each block can be programmed and erased up to 100000 cycles with ECC (error correction code) on. To extend the lifetime of NAND flash devices, the implementation of an ECC is mandatory. The chip supports CE# don"t care function. This function allows the direct download of the code from the NAND flash memory device by a microcontroller, since the CE# transitions do not stop the read operation. The device has a read cache feature that improves the read throughput for large files. During cache reading, the devices load the data in a cache register while the previous data is transferred to the I/O buffers to be read.

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- Surface testing

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