SN74LVTH182504APM - TI

The pictures are for reference only, and the specific specifications can be found in the product manual.

Part No

SN74LVTH182504APM
Manufacturer

TI
ChipWorker Part#

CW44982975
Category

Logic Control, Logic Gate IC
Package

LQFP-64
Description

3.3V ABT Scan Test Devices With 20Bit Universal Bus Transceivers 64-LQFP -40℃ to 85℃
Documentation

Datasheet

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SN74LVTH182504APM Specifications

Attribute	Attribute Value

Part Number	SN74LVTH182504APM
Manufacturer	TI
ChipWorker Part#	CW44982975
Category	Logic Control, Logic Gate IC
Documentation	Datasheet
Mounting Style	Surface Mount
Number of Pins	64 Pin
Case/Package	LQFP-64
Supply Voltage (DC)	2.70V ~ 3.60V
Number of Outputs	20 Output
Number of Channels	20 Channel
Number of Bits	20 Bit
Propagation Delay Max (tpd)	5.90 ns
Voltage Nodes	3.30 V, 2.70 V
Output Current Drive	-500 µA
Operating Temperature (Max)	85 ℃
Operating Temperature (Min)	-40 ℃
Supply Voltage	2.7V ~ 3.6V
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Operating Temperature	-40℃ ~ 85℃
Product Lifecycle Status	Active
Packaging	Tray
RoHS	RoHS Compliant
Lead-Free Status	Lead Free

Product Description

The "LVTH18504A and "LVTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL interface to a 5-V system environment.
In the normal mode, these devices are 20-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE universal bus transceivers.
Data flow in each direction is controlled by output-enable ( and ), latch-enable (LEAB and LEBA), clock-enable ( and ), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is low, the A-bus data is latched while is high and/or CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low and is low, A-bus data is stored on a low-to-high transition of CLKAB. When is low, the B outputs are active. When is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow, but uses the , LEBA,, and CLKBA inputs.
In the test mode, the normal operation of the SCOPE universal bus transceivers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Std 1149.1-1990.
Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions, such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
The B-port outputs of "LVTH182504A, which are designed to source or sink up to 12 mA, include equivalent 25- series resistors to reduce overshoot and undershoot.
The SN54LVTH18504A and SN54LVTH182504A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74LVTH18504A and SN74LVTH182504A are characterized for operation from -40°C to 85°C.

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