JS28F256M29EWLA - Micron

The pictures are for reference only, and the specific specifications can be found in the product manual.

Part No

JS28F256M29EWLA
Manufacturer

Micron
ChipWorker Part#

CW62628066
Category

Flash Memory, Flash
RoHS

Lead free / RoHS Compliant
Description

NOR Flash Parallel 3V/3.3V 256Mbit 32M/16M x 8Bit/16Bit 110ns 56Pin TSOP Tray
Documentation

Datasheet

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JS28F256M29EWLA Specifications

Attribute	Attribute Value

Part Number	JS28F256M29EWLA
Manufacturer	Micron
ChipWorker Part#	CW62628066
Category	Flash Memory, Flash
Documentation	Datasheet
Mounting Style	Surface Mount
Number of Pins	56 Pin
Case/Package	TSOP-56
Supply Voltage (DC)	2.70V (min)
Supply Current	31 mA
Number of Positions	56 Position
Number of Bits	8, 16 Bit
Access Time	110 ns
Memory Size	32000000 B
Access Time(Max)	110 ns
Operating Temperature (Max)	85 ℃
Operating Temperature (Min)	-40 ℃
Supply Voltage	2.7V ~ 3.6V
Supply Voltage (Max)	3.6 V
Supply Voltage (Min)	2.7 V
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Size-Length	18.4 mm
Size-Width	14 mm
Size-Height	1 mm
Operating Temperature	-40℃ ~ 85℃
Product Lifecycle Status	Active
Packaging	Tray
RoHS	RoHS Compliant
Lead-Free Status	Lead Free
REACH SVHC Compliance	No SVHC
REACH SVHC Compliance Edition	2014/06/16
ECCN Code	3A991.b.1.a

Product Description

The JS28F256M29EWLA is a 256MB asynchronous uniform block parallel NOR Flash EMBedded Memory manufactured on 65nm multilevel cell (MLC) technology. READ, ERASE and PROGRAM operations are performed using a single low-voltage supply. Upon power-up, the device defaults to read array mode. The main memory array is divided into uniform blocks that can be erased independently so that valid data can be preserved while old data is purged. PROGRAM and ERASE commands are written to the command interface of the memory. An on-chip program/erase controller simplifies the process of programming or erasing the memory by taking care of all special operations required to update the memory contents. The end of a PROGRAM or ERASE operation can be detected and any error condition can be identified. The command set required to control the device is consistent with JEDEC standards. The M29EW supports asynchronous random read and page read from all blocks of the array.
Asynchronous random/page read
Buffer program - 512-word program buffer
Memory organization - uniform blocks - 128-Kbytes or 64-Kwords each
Program/erase controller - embedded byte/word program algorithms
Program/erase suspend and resume capability
Read from any block during a PROGRAM SUSPEND operation
Read or program another block during an ERASE SUSPEND operation
BLANK CHECK operation to verify an erased block
Unlock bypass, block erase, chip erase and write to buffer capability
Fast buffered/batch programming
Fast block/chip erase
VPP/WP# pin protection - protects first or last block regardless of block protection settings
Software protection
Extended memory block
Programmed or locked at the factory or by the customer
Low power consumption - standby mode
100000 Minimum ERASE cycles per block
Data retention - 20 years typical

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- Vacuum packed
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- Anti-vibration foam
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- X-ray inspection
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- Electrical testing
- Surface testing

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