TC58NVG1S3HTAI0 - Toshiba

The pictures are for reference only, and the specific specifications can be found in the product manual.

Part No

TC58NVG1S3HTAI0
Manufacturer

Toshiba
ChipWorker Part#

CW78419467
Category

Flash Memory, Flash
Package

TSOP-48
Description

SLC NAND Flash 3.3V 2G-bit 256M x 8 48Pin TSOP-I
Documentation

Datasheet

TC58NVG1S3HTAI0 Global Supplier

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TC58NVG1S3HTAI0 Specifications

Attribute	Attribute Value

Part Number	TC58NVG1S3HTAI0
Manufacturer	Toshiba
ChipWorker Part#	CW78419467
Category	Flash Memory, Flash
Documentation	Datasheet
Mounting Style	Surface Mount
Number of Pins	48 Pin
Case/Package	TSOP-48
Number of Bits	8 Bit
Access Time	25 ns
Operating Temperature (Max)	85 ℃
Operating Temperature (Min)	-40 ℃
Supply Voltage	2.7V ~ 3.6V
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Operating Temperature	-40℃ ~ 85℃ (TA)
Product Lifecycle Status	Active
Packaging	Tray
RoHS	RoHS Compliant
Lead-Free Status	Lead Free
ECCN Code	EAR99

Product Description

Organization x8 Memory cell array 2176  128K  8 Register 2176  8 Page size 2176 bytes Block size (128K  8K) bytes  Modes Read, Reset, Auto Page Program, Auto Block Erase, Status Read, Page Copy, Multi Page Program, Multi Block Erase, Multi Page Copy, Multi Page Read  Mode control Serial input/output Command control  Number of valid blocks Min 2008 blocks Max 2048 blocks  Power supply VCC  2.7V to 3.6V  Access time Cell array to register 25 s max Serial Read Cycle 25 ns min (CL=50pF)  Program/Erase time Auto Page Program 300 s/page typ. Auto Block Erase 2.5 ms/block typ.  Operating current Read (25 ns cycle) 30 mA max. Program (avg.) 30 mA max Erase (avg.) 30 mA max Standby 50 A max

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- Please check the technical specifications of the products when ordering.
- MOQ is the minimum order quantity required to purchase each part.
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- Carefully tested and packaged by ChipWorker
- Vacuum packed
- Anti-static packaging
- Anti-vibration foam
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- Authorities test the chip to ensure the quality, authenticity and safety of your device.
- Decapsulation control
- X-ray inspection
- XRF inspection
- Electrical testing
- Surface testing

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