B82721K2362N001 - Epcos

The pictures are for reference only, and the specific specifications can be found in the product manual.

Part No

B82721K2362N001
Manufacturer

Epcos
ChipWorker Part#

CW14118303
Category

Inductor Choke
Package

18.2 mm x 13.2 mm x 20.3 mm
Description

Common Mode Choke Through Hole Power Line 3.6A 2 Lines 35mOhm (Typ) -40℃ ~ 125℃
Documentation

Datasheet

B82721K2362N001 Global Supplier

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B82721K2362N001 Specifications

Attribute	Attribute Value

Part Number	B82721K2362N001
Manufacturer	Epcos
ChipWorker Part#	CW14118303
Category	Inductor Choke
Documentation	Datasheet
Mounting Style	Through Hole
Case/Package	18.2 mm x 13.2 mm x 20.3 mm
Voltage Rating (AC)	250 V
Current Rating	3.6 A
Capacitance Tolerance	±30 %
Inductance	400 µH
Test Frequency	100 kHz
Current Rating (Max)	3.6 A
Operating Temperature (Max)	125 ℃
Operating Temperature (Min)	-40 ℃
Voltage Rating	250 VAC
Resistance (DC Max)	35 mΩ
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Size-Length	18.2 mm
Size-Width	13.2 mm
Size-Height	20.3 mm
Operating Temperature	-40℃ ~ 125℃
Product Lifecycle Status	Active
Packaging	Box
RoHS	RoHS Compliant
Lead-Free Status	Lead Free
REACH SVHC Compliance Edition	2015/06/15

Product Description

The B82721K series current-compensated ring core double Power Line Choke suitable for suppression of common-mode interference, electronic ballast in lamp, power inverter and switch-mode power applications. This B82721K series made of polycarbonate case and polyurethane potting with hot dipped tin over nickel terminals.
High resonance frequency due to special winding technique
Ferrite core with epoxy coating
Sector winding
1% Stray inductance for symmetrical interference suppression
Suitable for wave soldering
Design complies with EN 60938-2 (VDE 0565-2) and UL 1283
UL94V-0 Flammability rating

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- Carefully tested and packaged by ChipWorker
- Vacuum packed
- Anti-static packaging
- Anti-vibration foam
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- Authorities test the chip to ensure the quality, authenticity and safety of your device.
- Decapsulation control
- X-ray inspection
- XRF inspection
- Electrical testing
- Surface testing

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